IEST’s 70th Annual Technical Meeting

ESTECH is the leading conference for professionals in contamination control, cleanrooms, controlled environments, product reliability, environmental testing, and nanotechnology.

In its 70th year, ESTECH continues to be the place to discuss critical topics and shape standards that impact our industry and the world. Professionals of all career levels come to ESTECH to discover the latest, most reliable, and best methods for impacting controlled environments, qualifying products, executing tests, and so much more.

ATI’s Dr. Meng Hu, Applications Engineer, is presenting “The Rationale of Two-Point Calibration for Aerosol Photometers” on Tuesday, May 7 at 3:10-5:00 pm during the Cleanroom Particle Classification, Monitoring and Sampling Techniques session. Don’t miss this opportunity to hear Dr. Hu as he shares theory, data, and practical considerations from his recent technical papers.